K. Ding a,b)*, Q. Wang,a) Z. Jia,a) R. Tong,a) X. Wang b)
a)Department of Chemistry， Hebei Teacher’s University，Shijiazhuang 050016, China.
Received 27 September 2002; accepted in revised form 18 August 2003
Abstract
The influence of potential-scan number on the Schiff base self-assembled monolayer was probed by the Cyclic Voltammetry (CV) and Electrochemical Impedance Spectroscopy (EIS) techniques for the first time. The results showed that the charge transferring resistance (Rct) could be reduced with the potential-scan, suggesting that the structure of the self-assembled monolayer was altered. Also, the relationship between the content of C=N group, represented approximately by the reduction electric charge (Qr), and the monolayer’s packing degree which was represented by the value of Rct, was described. Providing a new way to change the interface characterization is the main contribution of this paper
]]> Keywords: number, influence, self-assembled monolayers, Schiff.
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*Corresponding author. E-mail address: dkeqiang@263.net
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